Table of Contents

Introduction to Electrostatic Discharge Protection. Design of Component-Level On-Chip ESD Protection for Integrated Circuits. ESD and EOS: Failure Mechanisms and Reliability. ESD, EOS, and Latch-Up Test Methods and Associated Reliability Concerns. Design of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS Technology. ESD Protection in Automotive Integrated Circuit Applications. ESD Sensitivity of GaN-Based Electronic Devices. ESD Protection Circuits Using NMOS Parasitic Bipolar Transistor. ESD Development in Foundry Processes. Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications. Advanced TCAD Methods for System-Level ESD Design. ESD Protection of Failsafe and Voltage-Tolerant Signal Pins. ESD Design and Optimization in Advanced CMOS SOI Technology.

About the Author

Juin J. Liou received his BS (honors), MS, and Ph.D in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the University of Central Florida (UCF), Orlando, where he is now Pegasus distinguished professor, Lockheed Martin St. Laurent professor, and UCF-Analog Devices fellow. Highly decorated and widely published, Dr. Liou holds eight US patents (with five more pending) and several honorary professorships. He is a fellow of IEEE, IET, and Singapore Institute of Manufacturing Technology, and a distinguished lecturer in the IEEE Electron Device Society and National Science Council.

Reviews

"… very timely, as the contributors are the experts within their respective fields and industries. … covers important applications of electrostatic discharge (ESD) protection circuits like automotive integrated circuits, GaN-based electronics, and advanced foundry processes. I strongly recommend this book to circuit designers and failure and analysis engineers."
—Kin-Leong Pey, Professor and Associate Provost, Singapore University of Technology and Design"An excellent team of experienced authors who have written and presented extensively on ESD protection of silicon chips, including tutorials and short courses at various conferences, are sure to come up with an outstanding book, both to serve as an introduction to those new in the field and to provide timely updates to those already working in it."
—Dimitris E. Ioannou, George Mason University, Fairfax, Virginia, USA"... enters into details about component-level protection, and this is a merit of the book because several books investigate solutions at the system level, but very few do so at the component level. ... a valuable resource to industrial designers of components based on complementary metal-oxide semiconductor (CMOS) technology and electronic equipment, as well as to development engineers. It will be of interest to managers and designers of consumer electronics and to researchers in electronics."
—Spartaco Caniggia, Signal Integrity (SI) and Electromagnetic Compatibility (EMC) Consultant"Edited by Dr. Juin J. Liou in collaboration with Krzysztof Iniewski and 20 other editors, Electrostatic Discharge Protection: Advances and Applications brings together a team of experienced and well-respected researchers and engineers from around the world, representing universities and semiconductor industries, with expertise in electrostatic discharge (ESD). This book truly represents the hall of fame of ESD. This book is an A-to-Z complete guide for the ASIC ESD designer; it includes charts, tables, test procedures, and standards, making it a must-have for every ESD designer."
—IEEE Microwave Magazine, August 2016