Table of Contents

Cosslett symposium: (speakers T Mulvey, W C Nixon, R W Horne, A Glauert, J V Long, P Duncumb, A Boyde, P W Hawkes). Invited papers: Recent advances in electron microprobe analysis (S J B Reed); Database and review of quantitative EMPA procedures (K F J Heinrich); Atomic resolution incoherent imaging and analysis with the STEM (S J Pennycook et al); The quantitative analysis of thin specimens (D B Williams); Imaging surfaces with scanning tunnelling and scanning force microscopes (H-J Butt); Aspects of 3-D imaging, display and measurement in light and scanning electron microscopy (A Boyde); Developments in image processing (P W Hawkes). Never mind the baby, how about the bath water?: insights from the secondary electron background in electron spectroscopy (J A D Matthew et al); The use of integrated circuits for position-sensitive detection (J Comer et al); Surface studies in UHV-SEM and STEM (J A Venables et al); Electron spectroscopy at high spatial resolution (P Kruit); The performance of the photoelectron spectromicroscope at low and high energies (D W Turner and I R Plummer); Laser-plasma XUV sources, advances in performance (F Bijkerk); X-ray microprobes based on Bragg-Fresnel crystal optics for high energy X-rays (V V Aristov et al); X-ray holography at the National Synchrotron Ligh Source (C Jacobsen et al); Review on the development of cone-beam X-ray microtomography (P C Cheng et al); The opportunities and challenges of using high brilliance X-ray synchotron sources (P Pattison); Present status of and future prospects for synchotron-based microtechniques that utilize X-ray fluorescence, absorption spectroscopy, diffraction and tomography (J V Smith); Properties and applications of soft x-ray undulators in structural and microstructural studies of the surfaces of materials (D P Woodruff); Review of EPMA and future developments (K F J Heinrich).